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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/case/SchieleJBKPSH21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andreas_Jansche>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anton_Kaiser>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Hollerith>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_Pfister>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefan_Sp%E2%88%9A%C2%A7th-Stockmeier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Timo_Bernthaler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tobias_Schiele>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCASE49439.2021.9551671>
foaf:homepage <https://doi.org/10.1109/CASE49439.2021.9551671>
dc:identifier DBLP conf/case/SchieleJBKPSH21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCASE49439.2021.9551671 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Comparison of deep learning-based image segmentation methods for the detection of voids in X-ray images of microelectronic components. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andreas_Jansche>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anton_Kaiser>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Hollerith>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_Pfister>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefan_Sp%E2%88%9A%C2%A7th-Stockmeier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Timo_Bernthaler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tobias_Schiele>
swrc:pages 1320-1325 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/case/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/case/SchieleJBKPSH21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/case/SchieleJBKPSH21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/case/case2021.html#SchieleJBKPSH21>
rdfs:seeAlso <https://doi.org/10.1109/CASE49439.2021.9551671>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/case>
dc:title Comparison of deep learning-based image segmentation methods for the detection of voids in X-ray images of microelectronic components. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document