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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cases/GuillenBLS14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Georg_Sigl>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Oscar_M._Guillen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ralf_Brederlow>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ralph_Ledwa>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F2668322.2668328>
foaf:homepage <https://doi.org/10.1145/2668322.2668328>
dc:identifier DBLP conf/cases/GuillenBLS14 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F2668322.2668328 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
rdfs:label Risk management in embedded devices using metering applications as example. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Georg_Sigl>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Oscar_M._Guillen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ralf_Brederlow>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ralph_Ledwa>
swrc:pages 6:1-6:9 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cases/2014wess>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cases/GuillenBLS14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cases/GuillenBLS14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cases/wess2014.html#GuillenBLS14>
rdfs:seeAlso <https://doi.org/10.1145/2668322.2668328>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cases>
dc:title Risk management in embedded devices using metering applications as example. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document