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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cav/SinghBM17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Clark_W._Barrett>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eshan_Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Subhasish_Mitra>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-319-63390-9%5F6>
foaf:homepage <https://doi.org/10.1007/978-3-319-63390-9_6>
dc:identifier DBLP conf/cav/SinghBM17 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-319-63390-9%5F6 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Clark_W._Barrett>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eshan_Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Subhasish_Mitra>
swrc:pages 104-125 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cav/2017-2>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cav/SinghBM17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cav/SinghBM17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cav/cav2017-2.html#SinghBM17>
rdfs:seeAlso <https://doi.org/10.1007/978-3-319-63390-9_6>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cav>
dc:title E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document