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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cce/Alarcon-SalazarARF12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ciro_Falcony>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._Alarcon-Salazar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mariano_Aceves-Mijares>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Roman-Lopez>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICEEE.2012.6421157>
foaf:homepage <https://doi.org/10.1109/ICEEE.2012.6421157>
dc:identifier DBLP conf/cce/Alarcon-SalazarARF12 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICEEE.2012.6421157 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
rdfs:label Characterization and fabrication of SiOx nano-metric films, obtained by reactive sputtering. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ciro_Falcony>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._Alarcon-Salazar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mariano_Aceves-Mijares>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Roman-Lopez>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iceee/2012>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cce/Alarcon-SalazarARF12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cce/Alarcon-SalazarARF12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iceee/iceee2012.html#Alarcon-SalazarARF12>
rdfs:seeAlso <https://doi.org/10.1109/ICEEE.2012.6421157>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cce>
dc:title Characterization and fabrication of SiOx nano-metric films, obtained by reactive sputtering. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document