Using Probabilistic Characterization to Reduce Runtime Faults in HPC Systems.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ccgrid/BrandtDGMPTW08
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ccgrid/BrandtDGMPTW08
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ann_C._Gentile
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bert_J._Debusschere
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/David_C._Thompson_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jackson_R._Mayo
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jim_M._Brandt
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Matthew_Wong
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Philippe_P._P%E2%88%9A%C2%A9bay
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FCCGRID.2008.124
>
foaf:
homepage
<
https://doi.org/10.1109/CCGRID.2008.124
>
dc:
identifier
DBLP conf/ccgrid/BrandtDGMPTW08
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FCCGRID.2008.124
(xsd:string)
dcterms:
issued
2008
(xsd:gYear)
rdfs:
label
Using Probabilistic Characterization to Reduce Runtime Faults in HPC Systems.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ann_C._Gentile
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bert_J._Debusschere
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/David_C._Thompson_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jackson_R._Mayo
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jim_M._Brandt
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Matthew_Wong
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Philippe_P._P%E2%88%9A%C2%A9bay
>
swrc:
pages
759-764
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ccgrid/2008
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ccgrid/BrandtDGMPTW08/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ccgrid/BrandtDGMPTW08
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ccgrid/ccgrid2008.html#BrandtDGMPTW08
>
rdfs:
seeAlso
<
https://doi.org/10.1109/CCGRID.2008.124
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ccgrid
>
dc:
subject
resilience, RAS, fault tolerance. probabilistic characterization, statistical analysis, abnormality detection, cluster monitoring
(xsd:string)
dc:
title
Using Probabilistic Characterization to Reduce Runtime Faults in HPC Systems.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document