| Property | Value |
|---|
|
dcterms:bibliographicCitation
|
<http://dblp.uni-trier.de/rec/bibtex/conf/ccs/2015trusted>
|
|
dc:creator
|
<https://dblp.l3s.de/d2r/resource/authors/Indrajit_Ray>
|
|
dc:creator
|
<https://dblp.l3s.de/d2r/resource/authors/Kui_Ren_0001>
|
|
dc:creator
|
<https://dblp.l3s.de/d2r/resource/authors/Xiaofeng_Wang>
|
|
swrc:editor
|
<https://dblp.l3s.de/d2r/resource/authors/Indrajit_Ray>
|
|
swrc:editor
|
<https://dblp.l3s.de/d2r/resource/authors/Kui_Ren_0001>
|
|
swrc:editor
|
<https://dblp.l3s.de/d2r/resource/authors/Xiaofeng_Wang>
|
|
foaf:homepage
|
<http://dx.doi.org/doi.org%2F10.1145%2F2808414>
|
|
foaf:homepage
|
<https://doi.org/10.1145/2808414>
|
|
dc:identifier
|
DBLP conf/ccs/2015trusted
(xsd:string)
|
|
dc:identifier
|
DOI doi.org%2F10.1145%2F2808414
(xsd:string)
|
|
dc:identifier
|
ISBN 978-1-4503-3828-8
(xsd:string)
|
|
swrc:isbn
|
ISBN 978-1-4503-3828-8
(xsd:string)
|
|
dcterms:issued
|
2015
(xsd:gYear)
|
|
rdfs:label
|
Proceedings of the 5th International Workshop on Trustworthy Embedded Devices, TrustED 2015, Denver, Colorado, USA, October 16, 2015
(xsd:string)
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/ccs/Condra15>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/ccs/Dijk15>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/ccs/MikityukPKFA15>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/ccs/NordholzVPJD15>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/ccs/SchallerS015>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/ccs/ScheelT15>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/ccs/Szefer15>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/ccs/Weimerskirch15>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/ccs/XieBS15>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/ccs/YeTCE15>
|
|
dc:publisher
|
ACM
(xsd:string)
|
|
owl:sameAs
|
<http://bibsonomy.org/uri/bibtexkey/conf/ccs/2015trusted/dblp>
|
|
owl:sameAs
|
<http://dblp.rkbexplorer.com/id/conf/ccs/2015trusted>
|
|
owl:sameAs
|
<urn:isbn:978-1-4503-3828-8>
|
|
rdfs:seeAlso
|
<http://amazon.com/s/ref=nb_ss_gw?field-keywords=978-1-4503-3828-8>
|
|
rdfs:seeAlso
|
<https://doi.org/10.1145/2808414>
|
|
swrc:series
|
<https://dblp.l3s.de/d2r/resource/conferences/ccs>
|
|
dcterms:tableOfContent
|
<http://dblp.uni-trier.de/db/conf/ccs/trusted2015.html>
|
|
dc:title
|
Proceedings of the 5th International Workshop on Trustworthy Embedded Devices, TrustED 2015, Denver, Colorado, USA, October 16, 2015
(xsd:string)
|
|
dc:type
|
<http://purl.org/dc/dcmitype/Collection>
|
|
rdf:type
|
swrc:Proceedings
|
|
rdf:type
|
foaf:Document
|
![[RDF data]](https://dblp.l3s.de/d2r/snorql/rdf_flyer.24.gif)