Challenges in Remote Attestation of Low-End Embedded Devices. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/ccs/Tsudik14>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Gene_Tsudik>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1145%2F2666141.2668383>
foaf:homepage	<https://doi.org/10.1145/2666141.2668383>
dc:identifier	DBLP conf/ccs/Tsudik14 (xsd:string)
dc:identifier	DOI doi.org%2F10.1145%2F2666141.2668383 (xsd:string)
dcterms:issued	2014 (xsd:gYear)
rdfs:label	Challenges in Remote Attestation of Low-End Embedded Devices. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Gene_Tsudik>
swrc:pages	1 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/ccs/2014trusted>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/ccs/Tsudik14/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/ccs/Tsudik14>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/ccs/trusted2014.html#Tsudik14>
rdfs:seeAlso	<https://doi.org/10.1145/2666141.2668383>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/ccs>
dc:title	Challenges in Remote Attestation of Low-End Embedded Devices. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document