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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ccwc/SajitT17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ahmed_S._Sajit>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_A._Turi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCCWC.2017.7868477>
foaf:homepage <https://doi.org/10.1109/CCWC.2017.7868477>
dc:identifier DBLP conf/ccwc/SajitT17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCCWC.2017.7868477 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label SEU tolerance of FinFET 6T SRAM, 8T SRAM and DICE memory cells. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ahmed_S._Sajit>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_A._Turi>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ccwc/2017>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ccwc/SajitT17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ccwc/SajitT17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ccwc/ccwc2017.html#SajitT17>
rdfs:seeAlso <https://doi.org/10.1109/CCWC.2017.7868477>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ccwc>
dc:title SEU tolerance of FinFET 6T SRAM, 8T SRAM and DICE memory cells. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document