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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cdc/Al-KharazAOCP19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bouchra_Ananou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacques_Pinaton>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michel_Combal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohammed_Al-Kharaz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mustapha_Ouladsine>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCDC40024.2019.9029698>
foaf:homepage <https://doi.org/10.1109/CDC40024.2019.9029698>
dc:identifier DBLP conf/cdc/Al-KharazAOCP19 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCDC40024.2019.9029698 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bouchra_Ananou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacques_Pinaton>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michel_Combal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohammed_Al-Kharaz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mustapha_Ouladsine>
swrc:pages 4741-4746 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cdc/2019>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cdc/Al-KharazAOCP19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cdc/Al-KharazAOCP19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cdc/cdc2019.html#Al-KharazAOCP19>
rdfs:seeAlso <https://doi.org/10.1109/CDC40024.2019.9029698>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cdc>
dc:title Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document