A Low Power Test Data Compression Scheme for Scan Test. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Bo_Ye>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.3233%2FFAIA220518>
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dc:identifier	DBLP conf/cecnet/Ye22 (xsd:string)
dc:identifier	DOI doi.org%2F10.3233%2FFAIA220518 (xsd:string)
dcterms:issued	2022 (xsd:gYear)
rdfs:label	A Low Power Test Data Compression Scheme for Scan Test. (xsd:string)
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swrc:pages	56-61 (xsd:string)
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rdfs:seeAlso	<https://doi.org/10.3233/FAIA220518>
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dc:title	A Low Power Test Data Compression Scheme for Scan Test. (xsd:string)
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