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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cf/BeckersUVVWDDGM22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arthur_Beckers>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Benedikt_Gierlichs>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jo_Vliegen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joan_Daemen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lennert_Wouters>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nele_Mentens>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roel_Uytterhoeven>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_Vandenabeele>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wim_Dehaene>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3528416.3530992>
foaf:homepage <https://doi.org/10.1145/3528416.3530992>
dc:identifier DBLP conf/cf/BeckersUVVWDDGM22 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3528416.3530992 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Energy and side-channel security evaluation of near-threshold cryptographic circuits in 28nm FD-SOI technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arthur_Beckers>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Benedikt_Gierlichs>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jo_Vliegen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joan_Daemen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lennert_Wouters>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nele_Mentens>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roel_Uytterhoeven>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_Vandenabeele>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wim_Dehaene>
swrc:pages 258-262 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cf/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cf/BeckersUVVWDDGM22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cf/BeckersUVVWDDGM22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cf/cf2022.html#BeckersUVVWDDGM22>
rdfs:seeAlso <https://doi.org/10.1145/3528416.3530992>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cf>
dc:title Energy and side-channel security evaluation of near-threshold cryptographic circuits in 28nm FD-SOI technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document