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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ches/OuahmaMHE17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Emmanuelle_Encrenaz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/In%E2%88%9A%C2%AEs_Ben_El_Ouahma>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Karine_Heydemann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Quentin_L._Meunier>
foaf:homepage <http://dx.doi.org/doi.org%2F10.29007%2Fhhnf>
foaf:homepage <https://doi.org/10.29007/hhnf>
dc:identifier DBLP conf/ches/OuahmaMHE17 (xsd:string)
dc:identifier DOI doi.org%2F10.29007%2Fhhnf (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label Symbolic Approach for Side-Channel Resistance Analysis of Masked Assembly Codes. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Emmanuelle_Encrenaz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/In%E2%88%9A%C2%AEs_Ben_El_Ouahma>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Karine_Heydemann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Quentin_L._Meunier>
swrc:pages 17-32 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ches/2017proofs>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ches/OuahmaMHE17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ches/OuahmaMHE17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ches/proofs2017.html#OuahmaMHE17>
rdfs:seeAlso <https://doi.org/10.29007/hhnf>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ches>
dc:title Symbolic Approach for Side-Channel Resistance Analysis of Masked Assembly Codes. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document