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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/chi/ChengTPGMA0023>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aditi_Maheshwari>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andreea_Danielescu_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eric_M._Gallo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gregory_D._Abowd>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyunjoo_Oh_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jung_Wook_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Taylor_Tabb>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tingyu_Cheng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3544548.3580811>
foaf:homepage <https://doi.org/10.1145/3544548.3580811>
dc:identifier DBLP conf/chi/ChengTPGMA0023 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3544548.3580811 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Functional Destruction: Utilizing Sustainable Materials' Physical Transiency for Electronics Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aditi_Maheshwari>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andreea_Danielescu_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eric_M._Gallo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gregory_D._Abowd>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyunjoo_Oh_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jung_Wook_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Taylor_Tabb>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tingyu_Cheng>
swrc:pages 366:1-366:16 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/chi/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/chi/ChengTPGMA0023/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/chi/ChengTPGMA0023>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/chi/chi2023.html#ChengTPGMA0023>
rdfs:seeAlso <https://doi.org/10.1145/3544548.3580811>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/chi>
dc:title Functional Destruction: Utilizing Sustainable Materials' Physical Transiency for Electronics Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document