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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cicc/ChoTKTD15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Carlos_Tokunaga>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_W._Tschanz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Minki_Cho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Muhammad_M._Khellah>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vivek_De>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCICC.2015.7338419>
foaf:homepage <https://doi.org/10.1109/CICC.2015.7338419>
dc:identifier DBLP conf/cicc/ChoTKTD15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCICC.2015.7338419 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Aging-aware Adaptive Voltage Scaling in 22nm high-K/metal-gate tri-gate CMOS. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Carlos_Tokunaga>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_W._Tschanz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Minki_Cho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Muhammad_M._Khellah>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vivek_De>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cicc/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cicc/ChoTKTD15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cicc/ChoTKTD15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cicc/cicc2015.html#ChoTKTD15>
rdfs:seeAlso <https://doi.org/10.1109/CICC.2015.7338419>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cicc>
dc:title Aging-aware Adaptive Voltage Scaling in 22nm high-K/metal-gate tri-gate CMOS. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document