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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cicc/HazuchaKWBTMSDN03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bradley_A._Bloechel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Greg_Dermer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_W._Tschanz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jose_Maiz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Krishnamurthy_Soumyanath>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_Hazucha>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shekhar_Borkar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Siva_G._Narendra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steven_Walstra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tanay_Kamik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vivek_De>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCICC.2003.1249472>
foaf:homepage <https://doi.org/10.1109/CICC.2003.1249472>
dc:identifier DBLP conf/cicc/HazuchaKWBTMSDN03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCICC.2003.1249472 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Measurements and analysis of SER tolerant latch in a 90 nm dual-Vt CMOS process. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bradley_A._Bloechel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Greg_Dermer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_W._Tschanz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jose_Maiz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Krishnamurthy_Soumyanath>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_Hazucha>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shekhar_Borkar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Siva_G._Narendra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steven_Walstra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tanay_Kamik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vivek_De>
swrc:pages 617-620 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cicc/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cicc/HazuchaKWBTMSDN03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cicc/HazuchaKWBTMSDN03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cicc/cicc2003.html#HazuchaKWBTMSDN03>
rdfs:seeAlso <https://doi.org/10.1109/CICC.2003.1249472>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cicc>
dc:title Measurements and analysis of SER tolerant latch in a 90 nm dual-Vt CMOS process. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document