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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cicc/KimSKDCKSBM13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyung-Ock_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_Seomun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jung_Yun_Choi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kee_Sup_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kyung_Tae_Do>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matthias_Sauer_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Subhasish_Mitra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Young_Moon_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCICC.2013.6658544>
foaf:homepage <https://doi.org/10.1109/CICC.2013.6658544>
dc:identifier DBLP conf/cicc/KimSKDCKSBM13 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCICC.2013.6658544 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyung-Ock_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_Seomun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jung_Yun_Choi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kee_Sup_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kyung_Tae_Do>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matthias_Sauer_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Subhasish_Mitra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Young_Moon_Kim>
swrc:pages 1-4 (xsd:string)
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cicc/KimSKDCKSBM13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cicc/cicc2013.html#KimSKDCKSBM13>
rdfs:seeAlso <https://doi.org/10.1109/CICC.2013.6658544>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cicc>
dc:title Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document