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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cicc/MatsumotoMOTMKY01>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans_J%E2%88%9A%C4%BErgen_Mattausch>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kyoji_Yamashita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mitiko_Miura-Mattausch>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Noriaki_Nakayama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Ooshiro>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shigetaka_Kumashiro>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shizunori_Matsumoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Terufumi_Yamaguchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Y._Tatsumi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCICC.2001.929801>
foaf:homepage <https://doi.org/10.1109/CICC.2001.929801>
dc:identifier DBLP conf/cicc/MatsumotoMOTMKY01 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCICC.2001.929801 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
rdfs:label Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans_J%E2%88%9A%C4%BErgen_Mattausch>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kyoji_Yamashita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mitiko_Miura-Mattausch>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Noriaki_Nakayama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Ooshiro>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shigetaka_Kumashiro>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shizunori_Matsumoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Terufumi_Yamaguchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Y._Tatsumi>
swrc:pages 357-360 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cicc/cicc2001.html#MatsumotoMOTMKY01>
rdfs:seeAlso <https://doi.org/10.1109/CICC.2001.929801>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cicc>
dc:title Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document