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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cicc/NiiyamaITS08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koichi_Ishida>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Makoto_Takamiya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takayasu_Sakurai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Taro_Niiyama>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCICC.2008.4672040>
foaf:homepage <https://doi.org/10.1109/CICC.2008.4672040>
dc:identifier DBLP conf/cicc/NiiyamaITS08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCICC.2008.4672040 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Expected vectorless Teacher-Student Swap (TSS) test method with dual power supply voltages for 0.3V homogeneous multi-core LSI's. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koichi_Ishida>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Makoto_Takamiya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takayasu_Sakurai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Taro_Niiyama>
swrc:pages 137-140 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cicc/2008>
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cicc/NiiyamaITS08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cicc/cicc2008.html#NiiyamaITS08>
rdfs:seeAlso <https://doi.org/10.1109/CICC.2008.4672040>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cicc>
dc:title Expected vectorless Teacher-Student Swap (TSS) test method with dual power supply voltages for 0.3V homogeneous multi-core LSI's. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document