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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cicc/PawlowskiCCTDFQBC14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Heather_Quinn>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_W._Tschanz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joseph_Crop>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Minki_Cho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Yin_Chiang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_Pawlowski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shekhar_Borkar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_Fairbanks>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vivek_De>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCICC.2014.6946138>
foaf:homepage <https://doi.org/10.1109/CICC.2014.6946138>
dc:identifier DBLP conf/cicc/PawlowskiCCTDFQBC14 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCICC.2014.6946138 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
rdfs:label Characterization of radiation-induced SRAM and logic soft errors from 0.33V to 1.0V in 65nm CMOS. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Heather_Quinn>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_W._Tschanz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joseph_Crop>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Minki_Cho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Yin_Chiang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_Pawlowski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shekhar_Borkar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_Fairbanks>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vivek_De>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cicc/2014>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cicc/PawlowskiCCTDFQBC14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cicc/PawlowskiCCTDFQBC14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cicc/cicc2014.html#PawlowskiCCTDFQBC14>
rdfs:seeAlso <https://doi.org/10.1109/CICC.2014.6946138>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cicc>
dc:title Characterization of radiation-induced SRAM and logic soft errors from 0.33V to 1.0V in 65nm CMOS. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document