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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cicc/VelamalaWPSJP22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_Johnston>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jyothi_Bhaskarr_Velamala>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuan-Yueh_James_Shen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Padma_Penmatsa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rachael_J._Parker>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Siang-jhih_Sean_Wu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCICC53496.2022.9772856>
foaf:homepage <https://doi.org/10.1109/CICC53496.2022.9772856>
dc:identifier DBLP conf/cicc/VelamalaWPSJP22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCICC53496.2022.9772856 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label PVT Tolerant Zero Bit-Error-Rate Physical Unclonable Function Exploiting Hot Carrier Injection Aging in 7nm FinFET Technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_Johnston>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jyothi_Bhaskarr_Velamala>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuan-Yueh_James_Shen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Padma_Penmatsa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rachael_J._Parker>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Siang-jhih_Sean_Wu>
swrc:pages 1-2 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/CICC53496.2022.9772856>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cicc>
dc:title PVT Tolerant Zero Bit-Error-Rate Physical Unclonable Function Exploiting Hot Carrier Injection Aging in 7nm FinFET Technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document