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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cifer/EydenWA95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._C._Arron>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._W._C._De_Wit>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._J._Van_Eyden>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCIFER.1995.495257>
foaf:homepage <https://doi.org/10.1109/CIFER.1995.495257>
dc:identifier DBLP conf/cifer/EydenWA95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCIFER.1995.495257 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Predicting company failure-a comparison between neural networks and established statistical techniques by applying the McNemar test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._C._Arron>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._W._C._De_Wit>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._J._Van_Eyden>
swrc:pages 91-96 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cifer/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cifer/EydenWA95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cifer/EydenWA95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cifer/cifer1995.html#EydenWA95>
rdfs:seeAlso <https://doi.org/10.1109/CIFER.1995.495257>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cifer>
dc:title Predicting company failure-a comparison between neural networks and established statistical techniques by applying the McNemar test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document