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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cis/WangW05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/BaoBao_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ye_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F11596448%5F49>
foaf:homepage <https://doi.org/10.1007/11596448_49>
dc:identifier DBLP conf/cis/WangW05 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F11596448%5F49 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label On_line Measurement System of Virtual Dielectric Loss Based on Wavelets and LabVIEW and Correlation Technics. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/BaoBao_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ye_Wang>
swrc:pages 343-348 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cis/2005-1>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cis/WangW05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cis/WangW05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cis/cis2005-1.html#WangW05>
rdfs:seeAlso <https://doi.org/10.1007/11596448_49>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cis>
dc:title On_line Measurement System of Virtual Dielectric Loss Based on Wavelets and LabVIEW and Correlation Technics. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document