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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Worraluk_Yamwong>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCISIS.2009.152>
foaf:homepage <https://doi.org/10.1109/CISIS.2009.152>
dc:identifier DBLP conf/cisis/YamwongKA09 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCISIS.2009.152 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label The Sampling-Based Sensitivity Analysis Model for Yield Improvement in HDD Manufacturing. (xsd:string)
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swrc:pages 1211-1216 (xsd:string)
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dc:title The Sampling-Based Sensitivity Analysis Model for Yield Improvement in HDD Manufacturing. (xsd:string)
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rdf:type swrc:InProceedings
rdf:type foaf:Document