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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cniot/XuYZSZG23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chuan_Xu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Feifei_Gu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jiankai_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Juan_Zhao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuping_Ye>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhan_Song>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3603781.3604228>
foaf:homepage <https://doi.org/10.1145/3603781.3604228>
dc:identifier DBLP conf/cniot/XuYZSZG23 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3603781.3604228 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label A Few-shot Learning Method for the Defect Inspection of Lithium Battery Sealing Nails. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chuan_Xu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Feifei_Gu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jiankai_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Juan_Zhao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuping_Ye>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhan_Song>
swrc:pages 983-989 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cniot/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cniot/XuYZSZG23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cniot/XuYZSZG23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cniot/cniot2023.html#XuYZSZG23>
rdfs:seeAlso <https://doi.org/10.1145/3603781.3604228>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cniot>
dc:title A Few-shot Learning Method for the Defect Inspection of Lithium Battery Sealing Nails. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document