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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Prateek_Dwivedi_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.4230%2FLIPIcs.CCC.2021.11>
foaf:homepage <https://doi.org/10.4230/LIPIcs.CCC.2021.11>
dc:identifier DBLP conf/coco/DuttaD021 (xsd:string)
dc:identifier DOI doi.org%2F10.4230%2FLIPIcs.CCC.2021.11 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Deterministic Identity Testing Paradigms for Bounded Top-Fanin Depth-4 Circuits. (xsd:string)
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swrc:pages 11:1-11:27 (xsd:string)
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dc:title Deterministic Identity Testing Paradigms for Bounded Top-Fanin Depth-4 Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document