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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/codes/SanderSB09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bj%E2%88%9A%E2%88%82rn_Sander>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%C4%BErgen_Schnerr>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Oliver_Bringmann_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1629435.1629469>
foaf:homepage <https://doi.org/10.1145/1629435.1629469>
dc:identifier DBLP conf/codes/SanderSB09 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1629435.1629469 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label ESL power analysis of embedded processors for temperature and reliability estimations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bj%E2%88%9A%E2%88%82rn_Sander>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%C4%BErgen_Schnerr>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Oliver_Bringmann_0001>
swrc:pages 239-248 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/codes/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/codes/SanderSB09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/codes/SanderSB09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/codes/codes2009.html#SanderSB09>
rdfs:seeAlso <https://doi.org/10.1145/1629435.1629469>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/codes>
dc:subject electronic system level, power analysis, reliability, temperature (xsd:string)
dc:title ESL power analysis of embedded processors for temperature and reliability estimations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document