Software Test Selection Patterns and Elusive Bugs. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/compsac/Howden05>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/William_E._Howden>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FCOMPSAC.2005.143>
foaf:homepage	<https://doi.org/10.1109/COMPSAC.2005.143>
dc:identifier	DBLP conf/compsac/Howden05 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FCOMPSAC.2005.143 (xsd:string)
dcterms:issued	2005 (xsd:gYear)
rdfs:label	Software Test Selection Patterns and Elusive Bugs. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/William_E._Howden>
swrc:pages	25-32 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/compsac/2005>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/compsac/Howden05/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/compsac/Howden05>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/compsac/compsac2005-1.html#Howden05>
rdfs:seeAlso	<https://doi.org/10.1109/COMPSAC.2005.143>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/compsac>
dc:subject	Testing, patterns, defects, elusive, models, design (xsd:string)
dc:title	Software Test Selection Patterns and Elusive Bugs. (xsd:string)
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rdf:type	swrc:InProceedings
rdf:type	foaf:Document