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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/compsac/TsaiYZP03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Feng_Zhu_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lian_Yu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Raymond_A._Paul>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei-Tek_Tsai>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCMPSAC.2003.1245381>
foaf:homepage <https://doi.org/10.1109/CMPSAC.2003.1245381>
dc:identifier DBLP conf/compsac/TsaiYZP03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCMPSAC.2003.1245381 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Rapid Verification of Embedded Systems Using Patterns. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Feng_Zhu_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lian_Yu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Raymond_A._Paul>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei-Tek_Tsai>
swrc:pages 466-471 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/compsac/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/compsac/TsaiYZP03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/compsac/TsaiYZP03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/compsac/compsac2003.html#TsaiYZP03>
rdfs:seeAlso <https://doi.org/10.1109/CMPSAC.2003.1245381>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/compsac>
dc:subject Verification patterns, verification, testing, model checking, embedded systems (xsd:string)
dc:title Rapid Verification of Embedded Systems Using Patterns. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document