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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cosade/HasegawaMWMN24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuki_Monta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Makoto_Nagata>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rikuu_Hasegawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takuji_Miki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takuya_Wadatsumi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-031-57543-3%5F2>
foaf:homepage <https://doi.org/10.1007/978-3-031-57543-3_2>
dc:identifier DBLP conf/cosade/HasegawaMWMN24 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-031-57543-3%5F2 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
rdfs:label On-Chip Evaluation of Voltage Drops and Fault Occurrence Induced by Si Backside EM Injection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuki_Monta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Makoto_Nagata>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rikuu_Hasegawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takuji_Miki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takuya_Wadatsumi>
swrc:pages 22-37 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cosade/2024>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cosade/cosade2024.html#HasegawaMWMN24>
rdfs:seeAlso <https://doi.org/10.1007/978-3-031-57543-3_2>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cosade>
dc:title On-Chip Evaluation of Voltage Drops and Fault Occurrence Induced by Si Backside EM Injection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document