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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/cscloud/TangZY22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Baijian_Yang_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tonglin_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Weitao_Tang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCSCloud-EdgeCom54986.2022.00012>
foaf:homepage <https://doi.org/10.1109/CSCloud-EdgeCom54986.2022.00012>
dc:identifier DBLP conf/cscloud/TangZY22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCSCloud-EdgeCom54986.2022.00012 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label SemiCon: A Semi-supervised Learning for Industrial Image Inspection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Baijian_Yang_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tonglin_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Weitao_Tang>
swrc:pages 12-17 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/cscloud/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/cscloud/TangZY22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/cscloud/TangZY22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/cscloud/cscloud2022.html#TangZY22>
rdfs:seeAlso <https://doi.org/10.1109/CSCloud-EdgeCom54986.2022.00012>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/cscloud>
dc:title SemiCon: A Semi-supervised Learning for Industrial Image Inspection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document