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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/csse/HuangZYZ08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fengquan_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ming_Yu_0006>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yanyan_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yue_Zhao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FCSSE.2008.536>
foaf:homepage <https://doi.org/10.1109/CSSE.2008.536>
dc:identifier DBLP conf/csse/HuangZYZ08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FCSSE.2008.536 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Silicon Wafer Defect Extraction Based on Morphological Filter and Watershed Algorithm. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fengquan_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ming_Yu_0006>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yanyan_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yue_Zhao>
swrc:pages 141-144 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/csse/2008-6>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/csse/HuangZYZ08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/csse/HuangZYZ08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/csse/csse2008-6.html#HuangZYZ08>
rdfs:seeAlso <https://doi.org/10.1109/CSSE.2008.536>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/csse>
dc:title Silicon Wafer Defect Extraction Based on Morphological Filter and Watershed Algorithm. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document