Testing for bridging faults (shorts) in CMOS circuits. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/dac/Acken83>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/John_M._Acken>
foaf:homepage	<http://dl.acm.org/citation.cfm?id=800749>
dc:identifier	DBLP conf/dac/Acken83 (xsd:string)
dcterms:issued	1983 (xsd:gYear)
rdfs:label	Testing for bridging faults (shorts) in CMOS circuits. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/John_M._Acken>
swrc:pages	717-718 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/dac/1983>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/dac/Acken83/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/dac/Acken83>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/dac/dac1983.html#Acken83>
rdfs:seeAlso	<http://dl.acm.org/citation.cfm?id=800749>
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dc:title	Testing for bridging faults (shorts) in CMOS circuits. (xsd:string)
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