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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/AhmedTJ07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohammad_Tehranipoor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nisar_Ahmed>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vinay_Jayaram>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1278480.1278616>
foaf:homepage <https://doi.org/10.1145/1278480.1278616>
dc:identifier DBLP conf/dac/AhmedTJ07 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1278480.1278616 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohammad_Tehranipoor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nisar_Ahmed>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vinay_Jayaram>
swrc:pages 533-538 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/AhmedTJ07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/AhmedTJ07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2007.html#AhmedTJ07>
rdfs:seeAlso <https://doi.org/10.1145/1278480.1278616>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:title Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document