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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/BandiDK06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Murty_Dasaka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pavan_K._Kumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Uday_Reddy_Bandi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1146909.1146961>
foaf:homepage <https://doi.org/10.1145/1146909.1146961>
dc:identifier DBLP conf/dac/BandiDK06 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1146909.1146961 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Design in reliability for communication designs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Murty_Dasaka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pavan_K._Kumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Uday_Reddy_Bandi>
swrc:pages 188-192 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/BandiDK06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/BandiDK06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2006.html#BandiDK06>
rdfs:seeAlso <https://doi.org/10.1145/1146909.1146961>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:subject EDA tools, electro migration, nanometer design challenges, reliability, self heat (xsd:string)
dc:title Design in reliability for communication designs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document