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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/BurchNYH88>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dale_E._Hocevar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Farid_N._Najm>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ping_Yang_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Richard_Burch>
foaf:homepage <http://portal.acm.org/citation.cfm?id=285730.285778>
dc:identifier DBLP conf/dac/BurchNYH88 (xsd:string)
dcterms:issued 1988 (xsd:gYear)
rdfs:label Pattern-Independent Current Estimation for Reliability Analysis of CMOS Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dale_E._Hocevar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Farid_N._Najm>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ping_Yang_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Richard_Burch>
swrc:pages 294-299 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/1988>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/BurchNYH88/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/BurchNYH88>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac88.html#BurchNYH88>
rdfs:seeAlso <http://portal.acm.org/citation.cfm?id=285730.285778>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:title Pattern-Independent Current Estimation for Reliability Analysis of CMOS Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document