High-Level Test Generation for Design Verification of Pipelined Microprocessors.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dac/CampenhoutMH99
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1999
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High-Level Test Generation for Design Verification of Pipelined Microprocessors.
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design verification, high-level test generation, pipelined microprocessors, sequential test generation
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High-Level Test Generation for Design Verification of Pipelined Microprocessors.
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