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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/CapodieciGKSY04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andrew_B._Kahng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jie_Yang_0010>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luigi_Capodieci>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Puneet_Gupta_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F996566.996658>
foaf:homepage <https://doi.org/10.1145/996566.996658>
dc:identifier DBLP conf/dac/CapodieciGKSY04 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F996566.996658 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Toward a methodology for manufacturability-driven design rule exploration. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andrew_B._Kahng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jie_Yang_0010>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Luigi_Capodieci>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Puneet_Gupta_0001>
swrc:pages 311-316 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/CapodieciGKSY04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/CapodieciGKSY04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2004.html#CapodieciGKSY04>
rdfs:seeAlso <https://doi.org/10.1145/996566.996658>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:subject OPC, RET, VLSI manufacturability, lithography, process variation, yield (xsd:string)
dc:title Toward a methodology for manufacturability-driven design rule exploration. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document