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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/ChellappaNYHVCCC10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jia_Ni>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jyothi_Velamala>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lawrence_T._Clark>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Min_Chen_0024>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nathan_D._Hindman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Srivatsan_Chellappa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoyin_Yao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Cao_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1837274.1837454>
foaf:homepage <https://doi.org/10.1145/1837274.1837454>
dc:identifier DBLP conf/dac/ChellappaNYHVCCC10 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1837274.1837454 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label In-situ characterization and extraction of SRAM variability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jia_Ni>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jyothi_Velamala>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lawrence_T._Clark>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Min_Chen_0024>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nathan_D._Hindman>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Srivatsan_Chellappa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoyin_Yao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Cao_0001>
swrc:pages 711-716 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/ChellappaNYHVCCC10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/ChellappaNYHVCCC10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2010.html#ChellappaNYHVCCC10>
rdfs:seeAlso <https://doi.org/10.1145/1837274.1837454>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:subject SRAM test, data retention voltage, extraction, threshold voltage variation, write margin (xsd:string)
dc:title In-situ characterization and extraction of SRAM variability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document