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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/ChengGSQH09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Costas_J._Spanos>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kun_Qian_0014>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lei_He_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lerong_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Puneet_Gupta_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1629911.1629945>
foaf:homepage <https://doi.org/10.1145/1629911.1629945>
dc:identifier DBLP conf/dac/ChengGSQH09 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1629911.1629945 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Physically justifiable die-level modeling of spatial variation in view of systematic across wafer variability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Costas_J._Spanos>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kun_Qian_0014>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lei_He_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lerong_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Puneet_Gupta_0001>
swrc:pages 104-109 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/ChengGSQH09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/ChengGSQH09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2009.html#ChengGSQH09>
rdfs:seeAlso <https://doi.org/10.1145/1629911.1629945>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:subject SSTA, leakage analysis, process variaion, timing (xsd:string)
dc:title Physically justifiable die-level modeling of spatial variation in view of systematic across wafer variability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document