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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/FickDHBBS09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andrew_DeOrio>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_Fick>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_T._Blaauw>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jin_Hu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Valeria_Bertacco>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1629911.1630119>
foaf:homepage <https://doi.org/10.1145/1629911.1630119>
dc:identifier DBLP conf/dac/FickDHBBS09 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1629911.1630119 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Vicis: a reliable network for unreliable silicon. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andrew_DeOrio>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_Fick>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_T._Blaauw>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jin_Hu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Valeria_Bertacco>
swrc:pages 812-817 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/FickDHBBS09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/FickDHBBS09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2009.html#FickDHBBS09>
rdfs:seeAlso <https://doi.org/10.1145/1629911.1630119>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:subject N-modular redundancy, Network-on-Chip, built-in-self-test, fault tolerance, hard faults, reconfiguration, torus (xsd:string)
dc:title Vicis: a reliable network for unreliable silicon. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document