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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/KangKIAR07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ahmad_E._Islam>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Keejong_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kunhyuk_Kang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Muhammad_Ashraful_Alam>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1278480.1278572>
foaf:homepage <https://doi.org/10.1145/1278480.1278572>
dc:identifier DBLP conf/dac/KangKIAR07 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1278480.1278572 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ahmad_E._Islam>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Keejong_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kunhyuk_Kang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Muhammad_Ashraful_Alam>
swrc:pages 358-363 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/KangKIAR07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/KangKIAR07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2007.html#KangKIAR07>
rdfs:seeAlso <https://doi.org/10.1145/1278480.1278572>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:title Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document