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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/KarlBSM06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_T._Blaauw>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eric_Karl>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Trevor_N._Mudge>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1146909.1147174>
foaf:homepage <https://doi.org/10.1145/1146909.1147174>
dc:identifier DBLP conf/dac/KarlBSM06 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1146909.1147174 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Reliability modeling and management in dynamic microprocessor-based systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_T._Blaauw>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eric_Karl>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Trevor_N._Mudge>
swrc:pages 1057-1060 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/KarlBSM06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/KarlBSM06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2006.html#KarlBSM06>
rdfs:seeAlso <https://doi.org/10.1145/1146909.1147174>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:subject dynamic reliability management, electromigration, modeling, oxide breakdown, thermal cycling (xsd:string)
dc:title Reliability modeling and management in dynamic microprocessor-based systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document