CMOS scaling beyond 32nm: challenges and opportunities. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/dac/Kuhn09>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Kelin_J._Kuhn>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1145%2F1629911.1629996>
foaf:homepage	<https://doi.org/10.1145/1629911.1629996>
dc:identifier	DBLP conf/dac/Kuhn09 (xsd:string)
dc:identifier	DOI doi.org%2F10.1145%2F1629911.1629996 (xsd:string)
dcterms:issued	2009 (xsd:gYear)
rdfs:label	CMOS scaling beyond 32nm: challenges and opportunities. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Kelin_J._Kuhn>
swrc:pages	310-313 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/dac/2009>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/dac/Kuhn09/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/dac/Kuhn09>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/dac/dac2009.html#Kuhn09>
rdfs:seeAlso	<https://doi.org/10.1145/1629911.1629996>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:subject	CMOS, high-k, metal-gate, orientation, strain (xsd:string)
dc:title	CMOS scaling beyond 32nm: challenges and opportunities. (xsd:string)
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rdf:type	swrc:InProceedings
rdf:type	foaf:Document