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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/KurimotoSAYOTS08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haruyuki_Ohkuma>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hidehiro_Takata>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroaki_Suzuki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hirofumi_Shinohara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masanori_Kurimoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rei_Akiyama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tadao_Yamanaka>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1391469.1391692>
foaf:homepage <https://doi.org/10.1145/1391469.1391692>
dc:identifier DBLP conf/dac/KurimotoSAYOTS08 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1391469.1391692 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Phase-adjustable error detection flip-flops with 2-stage hold driven optimization and slack based grouping scheme for dynamic voltage scaling. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haruyuki_Ohkuma>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hidehiro_Takata>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroaki_Suzuki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hirofumi_Shinohara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masanori_Kurimoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rei_Akiyama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tadao_Yamanaka>
swrc:pages 884-889 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/KurimotoSAYOTS08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/KurimotoSAYOTS08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2008.html#KurimotoSAYOTS08>
rdfs:seeAlso <https://doi.org/10.1145/1391469.1391692>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:subject CTS, DVS, STA, error-detection flip-flop (xsd:string)
dc:title Phase-adjustable error detection flip-flops with 2-stage hold driven optimization and slack based grouping scheme for dynamic voltage scaling. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document