An IC manufacturing yield model considering intra-die variations.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dac/LuoSSKC06
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/dac/LuoSSKC06
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Charles_C._Chiang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jamil_Kawa
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jianfeng_Luo
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Qing_Su
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Subarna_Sinha
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1145%2F1146909.1147100
>
foaf:
homepage
<
https://doi.org/10.1145/1146909.1147100
>
dc:
identifier
DBLP conf/dac/LuoSSKC06
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1145%2F1146909.1147100
(xsd:string)
dcterms:
issued
2006
(xsd:gYear)
rdfs:
label
An IC manufacturing yield model considering intra-die variations.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Charles_C._Chiang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jamil_Kawa
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jianfeng_Luo
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Qing_Su
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Subarna_Sinha
>
swrc:
pages
749-754
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/dac/2006
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/dac/LuoSSKC06/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/dac/LuoSSKC06
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/dac/dac2006.html#LuoSSKC06
>
rdfs:
seeAlso
<
https://doi.org/10.1145/1146909.1147100
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/dac
>
dc:
subject
CMP, manufacturing yield, random variation, spatial correlation, systematic variation
(xsd:string)
dc:
title
An IC manufacturing yield model considering intra-die variations.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document