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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/MukherjeeL14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Parijat_Mukherjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peng_Li_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F2593069.2593154>
foaf:homepage <https://doi.org/10.1145/2593069.2593154>
dc:identifier DBLP conf/dac/MukherjeeL14 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F2593069.2593154 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
rdfs:label Leveraging pre-silicon data to diagnose out-of-specification failures in mixed-signal circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Parijat_Mukherjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peng_Li_0001>
swrc:pages 9:1-9:6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2014>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/MukherjeeL14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/MukherjeeL14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2014.html#MukherjeeL14>
rdfs:seeAlso <https://doi.org/10.1145/2593069.2593154>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:title Leveraging pre-silicon data to diagnose out-of-specification failures in mixed-signal circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document