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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/OgiharaSM85>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shinichi_Murai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shuichi_Saruyama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takuji_Ogihara>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F317825.317859>
foaf:homepage <https://doi.org/10.1145/317825.317859>
dc:identifier DBLP conf/dac/OgiharaSM85 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F317825.317859 (xsd:string)
dcterms:issued 1985 (xsd:gYear)
rdfs:label PATEGE: an automatic DC parametric test generation system for series gated ECL circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shinichi_Murai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shuichi_Saruyama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takuji_Ogihara>
swrc:pages 212-218 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/1985>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/OgiharaSM85/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/OgiharaSM85>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac1985.html#OgiharaSM85>
rdfs:seeAlso <https://doi.org/10.1145/317825.317859>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:title PATEGE: an automatic DC parametric test generation system for series gated ECL circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document