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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/SaabHK00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bozena_Kaminska>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Khaled_Saab_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Naim_Ben-Hamida>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F337292.337775>
foaf:homepage <https://doi.org/10.1145/337292.337775>
dc:identifier DBLP conf/dac/SaabHK00 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F337292.337775 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Closing the gap between analog and digital. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bozena_Kaminska>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Khaled_Saab_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Naim_Ben-Hamida>
swrc:pages 774-779 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/SaabHK00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/SaabHK00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2000.html#SaabHK00>
rdfs:seeAlso <https://doi.org/10.1145/337292.337775>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:subject fault modeling, fault simulation, hard faults, test vector generation (xsd:string)
dc:title Closing the gap between analog and digital. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document