Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dac/SrivastavaSASBD05
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2005
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Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance.
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correlation, leakage, variability, yield
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Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance.
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