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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dac/VeetilSBSR09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_T._Blaauw>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saumil_Shah>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steffen_Rochel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vineeth_Veetil>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1629911.1629956>
foaf:homepage <https://doi.org/10.1145/1629911.1629956>
dc:identifier DBLP conf/dac/VeetilSBSR09 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1629911.1629956 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_T._Blaauw>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saumil_Shah>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steffen_Rochel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vineeth_Veetil>
swrc:pages 154-159 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dac/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dac/VeetilSBSR09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dac/VeetilSBSR09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dac/dac2009.html#VeetilSBSR09>
rdfs:seeAlso <https://doi.org/10.1145/1629911.1629956>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dac>
dc:subject Monte Carlo, statistical leakage, variance reduction (xsd:string)
dc:title Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document