Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dac/VeetilSBSR09
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Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence.
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Monte Carlo, statistical leakage, variance reduction
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Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence.
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